Journal of Electronic Testing

A Layout-Aware Pattern Grading Procedure for Critical Paths Considering Power Supply Noise and Crosstalk
A Modified Simulation-Based Multi-Signal Modeling for Electronic System
Analysis and Fault Modeling of Actual Resistive Defects in ATMEL eFlash Memories
Diagnostic Test Set Minimization and Full-Response Fault Dictionary
Editorial
Fault Detection of Analog Circuits Using Network Parameters
Self-Calibration of Output Match and Reverse Isolation in LNAs Based Switchable Resistor
Software-Based Testing for System Peripherals
Test Technology Newsletter
Tester Memory Requirements and Test Application Time Reduction for Delay Faults with Digital Captureless Test Sensors
Testing of Low-cost Digital Microfluidic Biochips with Non-Regular Array Layouts